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Application Analysis Form

Application Analysis Form 
Thank you for your interest in Lehighton Electronics Inc.'s contactless metrology equipment.
We are happy to have the opportunity to demonstrate the accuracy and repeatability of our instruments.

To enable us to better serve your measurement needs, please take a moment to complete our Application Analysis Form.  We will review your form and reply with the best solution for your application based on the data you provide.

Sample Testing Form
If you would like to send a sample for testing, be sure to include the specific information as requested.  In order to provide meaningful data and fast turnaround, please do the following before shipping samples to us for testing:

Sample Testing Form for each sample and fax or submit the form online to LEI before mailing your samples.  This will ensure that your samples are compatible with our equipment, and will help us to process them properly.

Also, please be sure that any layers you would like us to measure with our eddy current instrument are at least 10x more conductive than the substrate on which they were grown/deposited.

Please understand that the most resistive reference material available for calibrations of our measurement instruments is approx. 3000 ohms/square.  If your sample(s) to be measured is/are higher than this, please include a wafer with a known sheet resistance for calibration purposes.

Please note: it is possible to measure samples with higher resistance, but the accuracy and repeatability will be affected above 3,000 Ohms/square. 

Thank you again for your interest, and for taking the time to complete this form. We look forward to receiving your samples. 

CONTACT LEI
Sales and general inquiries -
lei@lehighton.com
Technical support - 
techsupport@lehighton.com

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LEHIGHTON  ELECTRONICS, INC. P.O. Box 328  Lehighton, PA 18235-0328 
 (800) 535-1112  (610) 377-5990  FAX (610) 377-6820

© 2005 Lehighton Electronics, Inc.