Model 2017
-dot sizes of 0.64 mm (.025"),1.27 mm
 (.050"),1.91 mm (.075") and 2.29 mm
 (.090") diameter

Model 2017B
-dot sizes of 0.46 mm (.018") or 0.64
 mm (.025");
- return dot size of 3.8 mm (.150")

additional dot sizes available

Applications
-Conductive substrates (Model 2017)
-Semi-insulating substrates
 (Model 2017B)
-Test sample size from 6.4 mm x 6.4 mm
 (.25"x.25")  to 150 mm (6") wafers
 standard models)

System Features
-Permanent machined orifice plate
 (no mylar replacement)
-Minimal series resistance via
 innovative Schottky/return dot
 configuration
-Precision vacuum control
-Unique vacuum Hg-pull/sample
  hold-down configuration improves
  repeatability of the mercury
  Schottky