LEI  1510M40
1510-level measurement capabilities at a reasonable price—perfect for university and low-volume production applications.
 

LEI Model 1600
Non-destructive carrier mobility, sheet charge density and sheet resistance measurements for 2" - 6" wafers

LEI 1500 Series
Process monitoring for high production yields, contactless sheet resistance and thickness of conductive process layers and thickness / resistivity of doped, bulk wafers 2"-200mm

LEI RS300
Process monitoring for high production yields, contactless sheet resistance and thickness of conductive process layers and thickness / resistivity of doped, bulk wafers 4"-300mm

LEI Miller Feedback Profiler
System II

LEI 2017/2017B
Mercury Probes

LEI Model 1530A
Flat Panel Display Sheet Resistance and Mapping

LEI Model 1500LS
Flat Panel Tool - Manual Positioning