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Hg Probe
Model 2017
• dot sizes of 0.64 mm (.025"),1.27 mm
 (.050"),1.91 mm (.075") and 2.29 mm
 (.090") diameter


Model 2017B


• dot sizes of 0.46 mm (.018")
or 0.64 mm (.025");

• return dot size of 3.8 mm (.150")

additional dot sizes available

 

  Hg Probe

Applications

• Conductive substrates (Model 2017) -

• Semi-insulating substrates (Model 2017B) -

• Test sample size from 6.4 mm x 6.4 mm
(.25"x.25") to 150 mm (6") wafers standard models)

System Features -

• Permanent machined orifice plate
(no mylar replacement) -

• Minimal series resistance via innovative Schottky/return dot configuration

• Precision vacuum control

• Unique vacuum Hg-pull/sample hold-down configuration improves repeatability of the
mercury Schottky

documentDownload the brochure

     

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LEHIGHTON  ELECTRONICS, INC . P.O. Box 328  Lehighton, PA 18235-0328 |  (800) 535-1112  | (610) 377-5990 | FAX (610) 377-6820