
Model 2017
• dot sizes of 0.64 mm (.025"),1.27 mm
(.050"),1.91 mm (.075") and 2.29 mm
(.090") diameter
Model 2017B
• dot sizes of 0.46 mm (.018")
or 0.64 mm (.025");
• return dot size of 3.8 mm (.150")
additional dot sizes available
Hg Probe
Applications
• Conductive substrates (Model 2017) -
• Semi-insulating substrates (Model 2017B) -
• Test sample size from 6.4 mm x 6.4 mm
(.25"x.25") to 150 mm (6") wafers standard models)
System Features -
• Permanent machined orifice plate
(no mylar replacement) -
• Minimal series resistance via innovative Schottky/return dot configuration
• Precision vacuum control
• Unique vacuum Hg-pull/sample hold-down configuration improves repeatability of the
mercury Schottky
Download the brochure
Sales and general inquiries | Technical support | ©2007 Lehighton Electronics, Inc.
LEHIGHTON ELECTRONICS, INC . P.O. Box 328 Lehighton, PA 18235-0328 | (800) 535-1112 | (610) 377-5990 | FAX (610) 377-6820